Atomique force microscope (AFM)
Atomic force microscopy is used to characterise objects deposited on various surfaces. Our equipment allows us to work under a variety of conditions, particularly in a biological environment, with the addition of a fluorescence microscope.
Equipment features
JPK Nanowizard III, combined with an inverted fluorescence microscope ZEISS Axio Observer
![microscope à force atomique © David Villa / Science Image CNRS photo du microscope à force atomique © David Villa / Science Image CNRS](https://softmat.fr/wp-content/uploads/2024/01/photo-AFM-DavidVilla-ScienceImageCNRS.webp)