Atomique force microscope (AFM)

Atomic force microscopy is used to characterise objects deposited on various surfaces. Our equipment allows us to work under a variety of conditions, particularly in a biological environment, with the addition of a fluorescence microscope.

Equipment features

JPK Nanowizard III, combined with an inverted fluorescence microscope ZEISS Axio Observer

photo du microscope à force atomique © David Villa / Science Image CNRS